You are currently exploring our in-stock options for part number 869-0045-419P with the NSN 6650015052157. This product is listed with the description “Crystal Holder Kit” and is manufactured by Thermo Electron North America Llc. If you are looking to purchase this part, we encourage you to complete and submit the RFQ form below with as much information as you can provide, such as your desired quantity, budget, shipping time frame, and more. Within 15 minutes of receiving and reviewing your submission, one of our experts will reach out with a quote that is tailored to your needs.
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We supply all relevant information alongside the listings on our website, that way you know you are always getting the exact item you require. For example, part number 869-0045-419P is listed alongside the NSN 6650-01-505-2157 and belongs to the FSC 6650 Optical Instruments Test Equipment Components And Accessories. Additionally, it is also under the CAGE Code 52787, which is assigned to Thermo Electron North America Llc. At Aerospace Procurement, you can trust that each product in our inventory is up to industry standards, as we are committed to various quality assurance practices. For example, we uphold a strict NO CHINA SOURCING pledge to ensure that each part is shipped out alongside its manufacturer trace documentation and qualifying certifications. These practices and more allow us to operate with AS9120B, ISO 9001:2015, and FAA AC 00-56B accreditation. Get in contact with us today to see how we can make the procurement process for part number 869-0045-419P seamless.
MRC | Criteria | Characteristic |
---|---|---|
FEAT | SPECIAL FEATURES | SILICON CRYSTAL WITH HIGH REFRACTIVE INDICES OF 3.4; SAMPLE DEPTH OF PENETRATION 0.85 MICROMETERS; TWO MODES OF OPERATION - VIEW, TO VIEW AND POSITION SAMPLE AND IR, USED FOR DATA COLLECTION; CONTACT ALERT SYSTEM SENSOR PLATE PROVIDED |
CXCY | III PART NAME ASSIGNED BY CONTROLLING AGENCY | SLIDE-ON ATTENUATED TOTAL REFLECTION MICROSCOPE ACCESSORY WITH SILICON CRYSTAL |
AGAV | III END ITEM IDENTIFICATION | CONTINUUM AND MOMENTUM MICROSCOPES |
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